The Aeonic Integrated Droop Response System is a groundbreaking approach to managing voltage droop in complex IC environments. This solution combines fast multi-threshold detection with churn-key integration of fine-grained dynamic voltage and frequency scaling capabilities.
It offers advanced features such as tight coupling of droop detection and response, leading to the fastest commercial adaptation times that can significantly reduce margin requirements and power usage. The system’s observability features provide valuable data for silicon health assessments and lifecycle management.
Process portability ensures scalability across different technology nodes, making the solution versatile for use in various sophisticated systems. This system is crucial for managing droop-induced challenges, and its integration with current architectures leads to enhanced system power and performance efficiency.
