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Scan Ring Linker is a flexible IP module designed for ease of insertion into CPLD, FPGA, or ASIC designs to simplify the JTAG test infrastructure. The SRL module is effective at managing 1149.1 (JTAG) complexities involving multiple scan rings. By combining multiple scan paths into a single high-speed test bus, it facilitates efficient testing and configuration through a singular external interface, allowing for independent testing and configuration of devices linked via secondary chains.
SystemBIST is a powerful, user-independent IC for flexible FPGA configuration and embedded JTAG test, offering vendor independence for any IEEE 1532 or IEEE 1149.1 compliant device. This complete plug-and-play module ensures high-quality self-testable and reconfigurable products. SystemBIST is designed to store FPGA configurations and manufacturing test suites compressed in system memory, facilitating tests anywhere a system can be powered. It features embedded boundary-scan tests and a history of sensitive updates with assurance of bitstream authenticity and security.
The Fast Access Controller is a pre-engineered asset for microcontroller and ASIC/SoC designers aiming to enhance Design-for-Test and improve flash programming performance. This patented solution offers a rapid on-board memory programming pathway, especially for setups where memory modules connect through a 1149.1/JTAG bus. FAC optimizes programming, delivering swift operational efficiency and enhancing development cycles by bridging the interface connection between a device and its onboard FLASH module.
This offering from Intellitech supports IEEE 1149.1 ICs and JTAG test components, focusing heavily on boundary scan software. It includes the TEST-IP family, designed for 1149.1 test, flash programming, and FPGA configuration, thus lowering system costs. These scan components create high-quality self-testable products that are re-configurable in the field using JTAG techniques. Features include ARM CPU emulation test support and analogue test via GPIB/VISA/PXI instruments, integrated into Intellitech's Eclipse Test Environment, offering comprehensive debugging capabilities.
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